METHOD AND APPARATUS FOR TESTING INDUCTION APPARATUS FOR ELECTRODYNAMIC RESISTANCE IN CASE OF SHORT-CIRCUIT

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to electrical energy. the purpose of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - increase in the u0438u0441u043fu043eu043bu044cu0437u043eu0432u0430u043du0438u00a0 power sources of u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 and increase the service life of the u043eu0431u043eu0440u0443u0434u043eu0432u0430u043du0438u00a0 d. u043eu0441u0442u0438u0433u0430u0435u0442u0441u00a0 by u0441u043du0438u0436u0435u043du0438u00a0 currents in the test equipment. in a moment of time with the help of u043au043eu043cu043cu0443u0442u0438u0440u0443u044eu0449u0435u0433u043e apparatus 10 serves to test the first test u043du0430u043fu0440u00a0u0436u0435u043du0438u0435.after a period of time by u043au043eu043cu043cu0443u0442u0438u0440u0443u044eu0449u0435u0433u043e apparatus 13 is the second test u043du0430u043fu0440u00a0u0436u0435u043du0438u0435, u0441u0434u0432u0438u043du0443u0442u043eu0435 phase relative to the first. at the time of the first transition through the zero curve of current in circuit test u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 first cut off the source. after a period of time turn off the second test u043du0430u043fu0440u00a0u0436u0435u043du0438u0435.through the test u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 u043eu0442u043au043bu044eu0447u0435u043du0438u00a0 when crossing a zero test current u0441u043du0438u0436u0430u044eu0442u0441u00a0 currents in the sources, and taking into account the u0444u0430u0437u043eu0432u043eu0433 test apparatus on the shift of the two test u043du0430u043fu0440u00a0u0436u0435u043du0438u0439 u043eu0431u0435u0441u043fu0435u0447u0438u0432u0430u0435u0442u0441u00a0 increase multiples percussion test currents. 6).