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DEVICE FOR OPTICALLY MEASURING SURFACE HEIGHT OF OBJECT

机译:光学测量物体表面高度的装置

摘要

PURPOSE: To measure the height of an object optically with high sensibility. CONSTITUTION: An optical height measuring apparatus according to the trigonometrical measuring principle is provided with a first imaging system 20 for imaging a radiation spot on a surface 10 to be measured on a screen 30. The radiation spot 11 is formed of beams 2 impinging on the surface 10. The screen 30 is imaged on a position-detection radiation detecting system 50 by a second imaging system 40. The screen 30 is formed such that the radiation impinging from the surface 10 close to the screen 30 exits the screen toward a detecting system 50 nearly in the vertical direction, and the high correlation between the height ΔZ of the surface 10 and an image 51 in the position of an image 51 on the detecting system 50 is combined with the nearly vertical impingement of the radiation on the surface of the detecting system, so that the reflection from the surface of the detecting system 50 almost disappears.
机译:目的:以高灵敏度光学测量物体的高度。构成:根据三角测量原理的光学高度测量设备,配备有第一成像系统20,用于在屏幕30上对要测量的表面10上的辐射点成像。辐射点11由撞击在屏幕上的光束2形成。屏幕30通过第二成像系统40在位置检测辐射检测系统50上成像。屏幕30形成为使得从靠近屏幕30的表面10入射的辐射朝着检测系统离开屏幕。光学系统50在垂直方向上几乎垂直入射,并且表面10的高度ΔZ与图像51在检测系统50上的位置中的位置51之间的高相关性与放射线在光学系统表面上的几乎垂直的入射相结合。检测系统50,使得来自检测系统50表面的反射几乎消失。

著录项

  • 公开/公告号JPH04278408A

    专利类型

  • 公开/公告日1992-10-05

    原文格式PDF

  • 申请/专利权人 PHILIPS GLOEILAMPENFAB:NV;

    申请/专利号JP19910346512

  • 发明设计人 UIREMU DERUKU FUAN AMUSUTERU;

    申请日1991-12-27

  • 分类号G01B11/02;G01B11/24;G01C3/06;

  • 国家 JP

  • 入库时间 2022-08-22 05:40:25

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