Procedure for self-monitoring apparatus for checking cracks form optoelectronics, especially according to the procedure of magnetic powders and device for its realization

摘要

In this method, the workpieces are tested opto-electronically and with the aid of a computer for size, position and/or number of the cracks. Between individual or in each case all tests, one or more defects generated as simulation or artificially and corresponding to the workpiece cracks or defects, of in each case predetermined defect size dependent on the required test sensitivity are brought to the place or into the vicinity of the workpieces to be tested. These are opto-electronically tested and the instantaneous operability of the opto-electronic device including the computer is assessed via the test values of the simulated defects.