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SCHOTTKY JUNCTION TYPE SEMICONDUCTOR PHOTODETECTOR

机译:肖特基结型半导​​体光电探测器

摘要

PURPOSE: To attenuate a dark current by introducing a damage onto the semiconductor surface under a Schottky junction metal electrode. ;CONSTITUTION: Before formation of the metal electrodes 1 and 2 with which an anode electrode and a cathode electrode, consisting of Schottky metal, are constituted, a SiN mask layer is deposited, for example, by CVD on the surface of a semiconductor 3. Then, SiN, as a mask layer, is pattern-etched on the formation part of the metal electrodes 1 and 2 by RIE using CF4 and H2 gas, Ar gas and the like, for example, and a window is provided on the electrode forming part. Subsequently, ion-damage 4 is introduced under the formation part of the metal electrodes 1 and 2 of the semiconductor 3 by implanting Ar ions. As a result, the dark current, especially on the normal working bias voltage region can be decreased.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:通过在肖特基结金属电极下方的半导体表面上引入损伤来衰减暗电流。组成:在形成由肖特基金属构成的阳极和阴极的金属电极1和2之前,例如通过CVD在半导体3的表面上淀积SiN掩模层。然后,使用CF 4 和H 2 气体,Ar气体,通过RIE在金属电极1、2的形成部分上对作为掩模层的SiN进行图案蚀刻。例如,在电极形成部上设置有窗口。随后,通过注入Ar离子将离子损伤4引入到半导体3的金属电极1和2的形成部分下方。结果,可以减小暗电流,特别是在正常工作偏置电压区域上的暗电流。; COPYRIGHT:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH05267711A

    专利类型

  • 公开/公告日1993-10-15

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19920065297

  • 发明设计人 TANAKA KIYOTSUGU;OKUHORA AKIHIKO;

    申请日1992-03-23

  • 分类号H01L31/108;

  • 国家 JP

  • 入库时间 2022-08-22 05:20:56

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