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RESIST COATING DEVICE AND METHOD FOR SPIN-COATING WITH RESIST

机译:抗蚀剂涂覆装置及利用抗蚀剂进行旋涂的方法

摘要

PURPOSE: To suppress the generation of turbulent flow caused by high-speed rotation in spin-coating, and to realize uniform thickness of resist. ;CONSTITUTION: While holding a wafer 11 with a wafer chuck 10, a circular plate 13, which is rotated by a motor 12, is disposed above the wafer 11, in parallel with the wafer 11 and nearby the wafer 11. The distance between the circular plate 13 and the wafer 11 is 0.5mm, and the number of rotations and the rotating direction of the circular plate 13 are the same as those of the wafer 11. In the case of a wafer of 8-inch diameter, turbulent flow does not generate even at a rotational speed of above 4,000r/min, and ununiformity of the film thickness can be suppressed. At this time, varying range of uniformity of the film thickness is 4.0nm (40Å). The number of rotations of the circular plate 13 can be lower than that of the wafer 11 within the range of |ω1-ω2|=(ν/r02)×2.15×105.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:抑制旋涂中高速旋转引起的湍流的产生,并实现均匀的抗蚀剂厚度。 ;构成:在用晶片卡盘10固定晶片11的同时,由电动机12旋转的圆盘13置于晶片11上方,与晶片11平行,并靠近晶片11。圆板13和晶片11为0.5mm,并且圆板13的转数和旋转方向与晶片11相同。在直径为8英寸的晶片的情况下,会产生湍流即使在高于4,000r / min的转速下也不会产生,并且可以抑制膜厚度的不均匀性。此时,膜厚均匀性的变化范围为4.0nm(40ang)。圆板13的转数可以在|ω 1 2 | =(ν/ r 0 2 )×2.15×10 5 .;版权:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH05283331A

    专利类型

  • 公开/公告日1993-10-29

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19920111133

  • 发明设计人 IKEDA RIKIO;

    申请日1992-04-30

  • 分类号H01L21/027;B05C11/08;B05D1/40;G03F7/16;

  • 国家 JP

  • 入库时间 2022-08-22 05:18:43

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