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PHOTOMICROSENSOR OPERATION CHECK CIRCUIT AND CONTROL THEREOF

机译:光敏电阻操作检查电路及其控制

摘要

PURPOSE: To provide a photomicrosensor operation check circuit for correctly checking operation, and a control method thereof by detecting whether a failure is caused by reduction in the sensitivity due to adhesion of matters or to failure in a photomicrosensor, even when there is an adhered matter such as dust in the photomicrosensor. ;CONSTITUTION: Two transistors Q1, Q2 for controlling the supply power source in the emission side of a photomicrosensor 1 and resistances R1, R2 are provided. The output side of the resistance is connected to a light emitting diode 2 in this photomicrosensor operation check circuit. The amount of current flowing into the light emitting diode 2 is controlled by preferentially turning the transistors Q1 and Q2 on/off, and the intensity of the light of the light emitting diode 2 is thus controlled by a photomicrosensor operation check circuit.;COPYRIGHT: (C)1993,JPO&Japio
机译:用途:提供一种用于正确检查操作的光电传感器操作检查电路及其控制方法,该方法通过检测是否是由于物质粘附引起的灵敏度降低或光电传感器发生故障而引起的,即使存在粘附物也是如此例如光电传感器中的灰尘。 ;组成:提供了两个晶体管Q1,Q2,用于控制光电传感器1的发射侧的电源;以及电阻R1,R2。在该光电传感器操作检查电路中,电阻的输出侧连接至发光二极管2。通过优先接通/关断晶体管Q1和Q2来控制流入发光二极管2的电流量,从而通过光电传感器操作检查电路控制发光二极管2的光强度。 (C)1993,日本特许厅

著录项

  • 公开/公告号JPH05290982A

    专利类型

  • 公开/公告日1993-11-05

    原文格式PDF

  • 申请/专利权人 KOKUSAI ELECTRIC CO LTD;

    申请/专利号JP19920119866

  • 发明设计人 SHIBUYA TATSUO;

    申请日1992-04-15

  • 分类号H05B37/03;

  • 国家 JP

  • 入库时间 2022-08-22 05:17:10

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