首页> 外国专利> METHOD OF ANNEALING GAAS SUBSTRATE AND MANUFACTURE OF GAAS SEMICONDUCTOR DEVICE

METHOD OF ANNEALING GAAS SUBSTRATE AND MANUFACTURE OF GAAS SEMICONDUCTOR DEVICE

机译:GAAS衬底退火和GAAS半导体器件制造方法

摘要

PURPOSE: To provide a method of annealing an ion-implanted GaAs substrate which is high in activation rate and sharp in carrier distribution. ;CONSTITUTION: Si ions are implanted into the surface of a semi-insulating GaAs substrate, 1. Then, an SiO2 film 8 is formed all the surface of substrate 1 through a thermal CVD method. In succession, the semi-insulating GaAs substrate 1 is annealed at a temperature of 900°C for 10 seconds in an atmosphere of NH3 through an infrared lamp annealing device The GaAs substrate 1 is annealed in such a manner that the substrate 1 is placed on a carbon boat 1 where a thermocouple monitor is provided making its surface where where the SiO2 film 8 is formed face upward. By this setup, nitrogen atoms (N) contained in an atmosphere of NH3 are diffused into the SiO2 film through its surface, and an ion implanted surface layer 9 is activated.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:提供一种退火方法,该方法可活化速率高且载流子分布锐利的离子注入GaAs衬底。 ;组成:将Si离子注入到半绝缘GaAs衬底1的表面中。然后,通过热CVD法在衬底1的整个表面上形成SiO 2 膜8。接着,通过红外线灯退火装置,在NH 3 的气氛中,将半绝缘的GaAs基板1在900℃的温度下退火10秒钟。将基板1放置在设置有热电偶监测器的碳舟1上的方式是使形成有SiO 2 膜8的表面朝上。通过这种设置,包含在NH 3 气氛中的氮原子(N)通过其表面扩散到SiO 2 膜中,并激活了离子注入表面层9。 。;版权:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH0582555A

    专利类型

  • 公开/公告日1993-04-02

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP19910245481

  • 发明设计人 TAMURA AKIYOSHI;

    申请日1991-09-25

  • 分类号H01L21/338;H01L29/812;H01L21/265;H01L21/324;

  • 国家 JP

  • 入库时间 2022-08-22 05:13:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号