首页> 外国专利> PROBE OF INTERATOMIC FORCE MICROSCOPE FOR SCANNING TYPE TUNNEL ELECTRON MICROSCOPE

PROBE OF INTERATOMIC FORCE MICROSCOPE FOR SCANNING TYPE TUNNEL ELECTRON MICROSCOPE

机译:扫描型隧道电子显微镜的原子力显微镜研究

摘要

PURPOSE:To obtain a probe excellent in durability and simple to produce by covering the tip part of a metal wire having a pointed tip with a monomolecular film and covering the other part thereof with a laminated membrane and allowing a molecule having conductivity to be present in the surface part of the laminated membrane., CONSTITUTION:A non-aqueous solvent of a silane coupling agent such as CCl3Si(CH2)2(CF2)6(CH2)2SiCl3 is brought into contact with a tungsten wire 1 to generate hydrogen chloride removing reaction and a monomolecular film 2 is formed by washing using a non-aqueous solvent and washing using water. When this operation is repeated five times, five monomolecular layers 4 are obtained. Next, the tip part of the wire 1 is subjected to ashing treatment in oxygen plasma to remove the monomolecular laminated film only of the tip part and a silane coupling agent whose terminal is thiophene is reacted with the tip part to cover the outermost layer with conductive polythiophene 3.
机译:目的:要获得一种耐用性极佳且易于制造的探针,方法是用单分子膜覆盖具有尖头的金属线的末端部分,然后用层压膜覆盖其另一部分,并在其中存在具有导电性的分子。组成:构成膜的表面部分。组成:硅烷偶联剂的非水溶剂,例如CCl3Si(CH2)2(CF2)6(CH2)2SiCl3与钨丝1接触以产生氯化氢去除通过使用非水溶剂洗涤并用水洗涤来形成单分子膜2。当重复该操作五次时,获得五个单分子层4。接下来,对电线1的末端部分在氧等离子体中进行灰化处理,以仅除去末端部分的单分子层压膜,并且使末端为噻吩的硅烷偶联剂与该末端部分反应,以覆盖导电性的最外层。聚噻吩3。

著录项

  • 公开/公告号JPH0587559A

    专利类型

  • 公开/公告日1993-04-06

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP19910247970

  • 发明设计人 NAKAGAWA TORU;

    申请日1991-09-26

  • 分类号G01B21/30;

  • 国家 JP

  • 入库时间 2022-08-22 05:13:13

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号