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PROBE OF INTERATOMIC FORCE MICROSCOPE FOR SCANNING TYPE TUNNEL ELECTRON MICROSCOPE
PROBE OF INTERATOMIC FORCE MICROSCOPE FOR SCANNING TYPE TUNNEL ELECTRON MICROSCOPE
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机译:扫描型隧道电子显微镜的原子力显微镜研究
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摘要
PURPOSE:To obtain a probe excellent in durability and simple to produce by covering the tip part of a metal wire having a pointed tip with a monomolecular film and covering the other part thereof with a laminated membrane and allowing a molecule having conductivity to be present in the surface part of the laminated membrane., CONSTITUTION:A non-aqueous solvent of a silane coupling agent such as CCl3Si(CH2)2(CF2)6(CH2)2SiCl3 is brought into contact with a tungsten wire 1 to generate hydrogen chloride removing reaction and a monomolecular film 2 is formed by washing using a non-aqueous solvent and washing using water. When this operation is repeated five times, five monomolecular layers 4 are obtained. Next, the tip part of the wire 1 is subjected to ashing treatment in oxygen plasma to remove the monomolecular laminated film only of the tip part and a silane coupling agent whose terminal is thiophene is reacted with the tip part to cover the outermost layer with conductive polythiophene 3.
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