首页>
外国专利>
A probing apparatus having an automatic probe card installation mechanism and a semiconductor wafer testing system including the same
A probing apparatus having an automatic probe card installation mechanism and a semiconductor wafer testing system including the same
展开▼
机译:具有自动探针卡安装机构的探测设备和包括该探测设备的半导体晶片测试系统
展开▼
页面导航
摘要
著录项
相似文献
摘要
A probing apparatus including probes contacting with electrode pads of the semiconductor wafer for measuring a semiconductor wafer in which a probe card is safely and individually installed and a wafer testing system in which a plurality of probe cards are efficiently used are disclosed. A probing apparatus includes moving means 4 for receiving a card holder 2 accommodating a probe card 1, moving the card holder 2 into a position just below a pogo pin socket 3 to which the probe card 1 is attached, and lifting the card holder 2, and attaching means 5 for attaching the probe card 1 to the pogo pin socket 3.
展开▼