procedures for the review of halbleiterleistungsdioden and circuit to perform the procedure

摘要

The circuit contains a stage for generating a current of defined magnitude which is fed to the diode under test and passes through it in the forward direction. After the current has been flowing for a defined period, a blocking voltage is applied to the diode and the desired diode data are measured during the period of changeover from the conducting to the blocked state. USE/ADVANTAGE - Enables semiconducting diodes to be tested using large currents applied for short time to avoid thermal overload.