首页> 外国专利> PROCESS FOR THE SELECTIVE DEPOSITION OF THIN DIAMOND FILM BY CHEMICAL VAPOUR DEPOSITION

PROCESS FOR THE SELECTIVE DEPOSITION OF THIN DIAMOND FILM BY CHEMICAL VAPOUR DEPOSITION

机译:化学气相沉积法选择性沉积薄膜的方法

摘要

Thin diamond films are selectively deposited imagewise on a substrate by gas phase synthesis. The substrate may be either a silicon substrate or a basal thin diamond film formed beforehand on a substrate by gas phase synthesis. Where a silicon substrate is used, its surface is i) first abraded to give a surfaee roughness suitable for gas phase synthesis of diamond followed by ii) coating a uniform photoresist layer; iii) exposing the photoresist layer imagewise to illumination; iv) developing the thus-exposed photoresist layer, whereby exposed areas and unexposed areas are distinguished from each ether and the photoresist layer is eliminated in the exposed or unexposed areas; v) subjecting the surface of the silicon substrate in the areas, from which the photoresist layer has been eliminated, to reactive ion etching by a gas mixture discharge of CF4, Ar and O2; vi) dissolving any remaining photoresist layers; and vii) carrying out gas phase synthesis of diamond. When a basal thin diamond film is used, a coating material having a withstandable temperature higher than a substrate temperature required for gas phase synthesis of diamond and having a high etching selectivity to diamond eg amorpheus silicon is needed to cover areas other than areas where new thin diamond film is to be formed. In this embodiment the suriace is coated with a photoresist lithography, amorphous silicon is deposited over entire surfaces, the photoresist layer is lifted thereby producing a coating of silicon in those areas ether than where diamond is to be formed, and diamond is thereafter deposited in the gaps and the silicon depositss are removed. In a further embodiment a thin masking film having a melting point higher than a temperature to be employed for gas phase synthesis of diamond, eg amorphous silicon again, can be used to partly mask the surface of a basal diamond film by first applying the silicon over the entire surface, covering this layer with a photoresist layer by lithography in areas corresponding to where diamond is not to be deposited, eliminating the silicon in the areas not covered by the photoresist, producing a patterned silicon layer and depositing diamond in a pattern conforming with the intended surface areas of the basal thin diamond film. The silicon layer may then be removed. The coated products will find use as heat sinks, insulators in integrated circuits, semiconductor devices and optical waveguides.
机译:通过气相合成将金刚石薄膜薄膜选择性地以图像方式沉积在基底上。衬底可以是硅衬底或通过气相合成预先在衬底上形成的基底金刚石薄膜。在使用硅衬底的情况下,首先对其表面进行打磨,以产生适合金刚石气相合成的表面粗糙度,然后进行ii)涂覆均匀的光刻胶层; iii)将光致抗蚀剂层成像曝光。 iv)显影如此曝光的光致抗蚀剂层,由此将曝光区域和未曝光区域与每种醚区分开,并且在曝光或未曝光区域中消除光致抗蚀剂层; v)通过CF 4,Ar和O 2的气体混合排放,使已经除去了光刻胶层的区域中的硅衬底的表面经受反应性离子蚀刻; vi)溶解任何剩余的光刻胶层; vii)进行金刚石的气相合成。当使用基本的金刚石薄膜时,需要覆盖温度高于金刚石气相合成所需的基材温度并且对金刚石具有高蚀刻选择性的涂层材料,例如非晶硅,以覆盖新的薄层以外的区域。将形成金刚石膜。在该实施方案中,用光致抗蚀剂光刻法涂覆该表面,在整个表面上沉积无定形硅,提起光致抗蚀剂层,从而在将要形成金刚石的区域之外的那些区域中形成硅涂层,然后将金刚石沉积在该区域中。间隙和硅沉积物被去除。在另一个实施方案中,可以通过首先将硅涂覆在金刚石上,然后使用熔点高于金刚石气相合成所用温度的薄掩膜,例如非晶硅,来部分掩盖基底金刚石膜的表面。在整个表面上,通过光刻在与不沉积金刚石的区域相对应的区域中用光刻胶层覆盖该层,消除未被光刻胶覆盖的区域中的硅,从而形成图案化的硅层,并以与基层金刚石薄膜的预期表面积。然后可以去除硅层。涂覆的产品将用作散热器,集成电路,半导体器件和光波导中的绝缘体。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号