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MULTILAYER X-RAY MIRROR AND MULTILAYER X-RAY OPTICAL SYSTEM

机译:多层X射线反射镜和多层X射线光学系统

摘要

PURPOSE: To reflect only desired wavelengths using a multilayer X-ray mirror while suppressing reflection of other wavelengths. ;CONSTITUTION: A multilayer X-ray mirror comprises a thin film of W formed on a base 1 as a high-density layer 2 and a thin film of B4C formed as a low- density layer 3 with a periodic length of 2.5nm and a periodicity of 100, the thickness ratio of the W to the whole films being 0.5:1. Waves 4, 5 reflected at the surface of the high-density layer and a wave 6 reflected at the back of the high-density layer are obtained. When an X-ray is incident on the mirror at an angle of incidence of 10°, fundamental waves are reflected while reflection of secondary higher harmonic waves is suppressed. When the thickness ratio of the W to the whole films is 0.33:1, reflection of third higher harmonic waves is suppressed. Two multilayer X-ray mirrors of different thickness ratios of the W to the whole films are disposed parallel to each other to form a multilayer X-ray optical system.;COPYRIGHT: (C)1994,JPO&Japio
机译:目的:使用多层X射线反射镜仅反射所需的波长,同时抑制其他波长的反射。 ;构成:多层X射线镜包括在基底1上形成的W薄膜作为高密度层2和在低密度层3上形成的B 4 C薄膜周期长度为2.5nm且周期为100的情况下,W与整个膜的厚度比为0.5:1。获得在高密度层的表面反射的波4、5和在高密度层的背面反射的波6。当X射线以10°的入射角入射到反射镜上时,基波被反射,而二次谐波的反射被抑制。当W相对于整个膜的厚度比为0.33∶1时,抑制了三次高次谐波的反射。将W与整个膜的厚度比不同的两个多层X射线镜彼此平行放置,以形成多层X射线光学系统。;版权所有:(C)1994,JPO&Japio

著录项

  • 公开/公告号JPH06174897A

    专利类型

  • 公开/公告日1994-06-24

    原文格式PDF

  • 申请/专利权人 NIPPON TELEGR & TELEPH CORP NTT;

    申请/专利号JP19920330516

  • 发明设计人 ITABASHI SEIICHI;KURODA KENICHI;

    申请日1992-12-10

  • 分类号G21K1/06;G02B5/124;G02B5/28;

  • 国家 JP

  • 入库时间 2022-08-22 04:50:19

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