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ELECTRIC CHARACTERISTICS MEASURING APPARATUS FOR IC DEVICE

机译:集成电路器件的电气特性测量装置

摘要

PURPOSE: To make it possible to carry out test and measurement of various types of IC device by constituting a mechanism for bringing a tester into contact with an IC of a socket board, an interface board, and interconnecting board units. ;CONSTITUTION: An IC device D is discharged from a magazine at a loader section 3 and when the IC device arrives at a vertical shoot 5b through an inclining shoot 5a, it is positioned and connected with the contact mechanism 10 in a test head 2a in order to perform test and measurement. The contact mechanism 10 is constituted of three independent and mutually detachable members, i.e., an interface board 11, a plurality of interconnecting board units 12, and a socket board 13. A wiring pattern is formed on the surface of the interface board 11 whereas pin connecting parts are provided on the rear surface. Lead pins of the device D are inserted into the IC socket 14 on the socket board 13. In case of same outline different type device D, only the interface board 11 is required to be replaced.;COPYRIGHT: (C)1994,JPO&Japio
机译:用途:通过构成一种使测试仪与插座板,接口板和互连板单元的IC接触的机构,可以进行各种类型的IC器件的测试和测量。组成:IC装置D从装料器部分3的弹匣中排出,当IC装置通过倾斜的射钉5a到达垂直射钉5b时,将其定位并与测试头2a中的接触机构10连接。为了执行测试和测量。接触机构10由三个独立且相互可拆卸的构件构成,即,接口板11,多个互连板单元12和插座板13。在接口板11的表面上形成配线图案,而销钉在背面上设有连接部件。设备D的引脚插入插座板13上的IC插座14中。如果外形相同,类型不同的设备D,则只需要更换接口板11。版权所有:(C)1994,JPO&Japio

著录项

  • 公开/公告号JPH0682520A

    专利类型

  • 公开/公告日1994-03-22

    原文格式PDF

  • 申请/专利权人 HITACHI ELECTRON ENG CO LTD;

    申请/专利号JP19920260507

  • 发明设计人 SUZUKI TETSUYA;YOSHINO KENGO;

    申请日1992-09-04

  • 分类号G01R31/26;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 04:49:10

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