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INNER FACE INSPECTION EQUIPMENT FOR CIRCULAR VESSEL

机译:圆形容器内表面检查设备

摘要

PURPOSE: To allow highly accurate high speed detection of contamination around a seam by generating a subwindow of predetermined profile having center at a predetermined point on the extension of the seam thereby detecting black contamination in the vicinity of upper seam. ;CONSTITUTION: After a seam line L is determined by a seam line position determining circuit, coordinates of intersection P of the line L and a ring window 30 are calculated. A predetermined offset amount 44 is then added to the coordinates of the intersection P thus determining a point O'. A window region for an object to be inspected is then determined with a circle of predetermined radius (r) having center at the point O' as a subwindow 41. A rectangular region S circumscribing the subwindow 41 is then determined and the vicinity of upper seam 24 is S canned to deliver a masked multilevel gray image signal including only the seam part 24 to a defective image detecting circuit thus detecting defective pixel in the subwindow 41 region. In this regard, a region obtained by removing the background 45 from the subwindow 41 is set as an region to be inspected thus realizing high speed processing.;COPYRIGHT: (C)1994,JPO&Japio
机译:用途:通过在接缝的延伸部上的预定点处产生中心的预定轮廓的子窗口,从而允许对接缝周围的污染物进行高精度的高速检测,从而检测上接缝附近的黑色污染。 ;构成:在接缝线位置确定电路确定了接缝线L之后,计算出该线L与环形窗口30的交点P。然后将预定的偏移量44添加到交点P的坐标,从而确定点O'。然后,以预定半径(r)的圆为中心,以O点为中心,确定待检查物体的窗口区域作为子窗口41。然后,确定包围子窗口41的矩形区域S,并确定上接缝的附近。固定图24,以将仅包括接缝部分24的掩蔽的多级灰度图像信号传送到缺陷图像检测电路,从而检测子窗口41区域中的缺陷像素。在这方面,将通过从子窗口41去除背景45而获得的区域设置为要检查的区域,从而实现高速处理。COPYRIGHT:(C)1994,JPO&Japio

著录项

  • 公开/公告号JPH06160289A

    专利类型

  • 公开/公告日1994-06-07

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO LTD;

    申请/专利号JP19920313827

  • 发明设计人 TOYAMA KOICHI;

    申请日1992-11-25

  • 分类号G01N21/88;G01B11/30;G06F15/62;G06F15/68;

  • 国家 JP

  • 入库时间 2022-08-22 04:48:16

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