Process and apparatus for determining the parameters of structural-phasic irregularities in the surface-near layer of metals and alloys

摘要

The invention may be used for discovering and measuring local phase-structure inhomogeneity parameters in near-surface layers of metals and alloys. The method consists in radiating a screened tested surface with ionizing radiation and in measuring the concentrations of electric charges in the flow of their carriers simultaneously from "n" arbitrarily chosen areas of the screened surface with their subsequent conversion into partial electric signals determined by the contact potential difference, which allows, by means of processing the obtained signals, to determine, depending on the results of that processing, the parameters of the inhomogeneities. The device for determining the phase-structure inhomogeneity parameters comprises a primary converter (1) consisting of a screen (2) of a current conducting material and of an ionizing radiation source (4) and an electric parameter meter consisting of "n" electrically insulated and mutually immobile sensitive elements (3) intended for measuring the concentration of electric charges in the flows of their carriers, and the radiation source (4) being located at equal distance from the sensitive elements (3), a partial electric signal generator (8) connected to a computing unit (11) executed in different variants.