PROCESS AND APPARATUS FOR DETERMINING THE PARAMETERS OF STRUCTURAL-PHASIC IRREGULARITIES IN THE SURFACE-NEAR LAYER OF METALS AND ALLOYS

摘要

The invention can be used for recognising and measuring the parameters of local, structural-phasic irregularities in the surface-near layers of metals and alloys. According to the disclosed process, the protected surface to be tested is irradiated with ionising radiation and the concentration of electric charges in the carrier currents is measured at the same time in 'n' arbitrarily selected fields of the protected surface. These charges are then converted into partial electric signals determined by the contact differential of the signals. By processing the thus obtained signals, the irregularity parameters may be determined. The apparatus for recognising structural-phasic irregularities has a primary converter (1) with a shield (2) made of current-conducting material, as well as a source of ionising radiation (4) and a measurement device for the electric parameters, both arranged in the shield region. The primary converter further has a converter for the partial electric signals (8) and a data processing unit (11). The measurement device for the electric signals is designed as 'n' electrically insulated sensor elements (3) immovable with respect to each other for measuring the concentration of electric charges in the carrier currents.