METHOD OF MEASURING LIFE-TINE OF MINORITY CARRIERS IN ACTIVE REGION OF LIGHT-EMITTING DIODE

摘要

FIELD: electro-optics. SUBSTANCE: direct current pulse is passed through light-emitting diode. After it passed the relaxation time of electroluminescence is measured. This time is used for determining life-time of minority carriers in active region of light-emitting diode. To change duration of current pulses applied from w²D^-1 to 22τm, it is necessary to determine distribution of life-time of minority carriers in depth. EFFECT: improved precision.