首页>
外国专利>
Bidirectional digital driver stage with for the implementation of a clock-controlled shift register test architecture (boundary scan) shift register cells serving
Bidirectional digital driver stage with for the implementation of a clock-controlled shift register test architecture (boundary scan) shift register cells serving
展开▼
机译:双向数字驱动器级,用于实现时钟控制的移位寄存器测试架构(边界扫描)移位寄存器单元
展开▼
页面导航
摘要
著录项
相似文献
摘要
A first shift register cells (ASC1), forming a signature, incorporates a conventional cell (BSC) preceded by an input selector (MUX3) supplied with a shift path input (TDI) and an alternative input (AE) from two Exclusive-OR gates (EX1,EX2) and another selector (MUX4). Another cell (ASC2) producing the test pattern operates in two modes whereby either test pattern is applied to internal or external circuitry or the signature is formed from its test responses, according to the control of the driver amplifier (TE) by a third cell (ASCT). ADVANTAGE - Circuit can be tested with temporal efficiency using pseudo-random test pattern.
展开▼