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Prodn. of hole structure in silicon substrate - by producing pores in substrate by etching, forming mask on substrate and selectively etching

机译:产品硅基板中的孔结构的方法-通过蚀刻在基板中产生孔,在基板上形成掩模并选择性蚀刻

摘要

Prodn. of a hole structure in a silicon substrate comprises (a) producing pores (4) in the substrate (1) of monocrystalline n-doped Si by electrochemical etching in an electrolyte in contact with a 1st surface (2) of the substrate (1), in which the substrate is connected as anode and a current density affecting etch removal is adjusted, the pores corresponding to the depth of the hole structure (6), (b) producing a mask (5) on the 1st surface of the substrate (1), defining the cross-section of the hole structure (6) parallel to the 1st surface (2), and (c) selectively etching, in which the hole structure (6) is formed by removing the silicon forming the side walls of the pores (4) not covered by the mask (5). ADVANTAGE - The pore depth corresponds to the depth of the hole structure.
机译:产品硅衬底中的孔结构的步骤包括:(a)在与衬底(1)的第一表面(2)接触的电解质中通过电化学蚀刻在单晶n掺杂的硅衬底(1)中产生孔(4)。在其中将基板连接为阳极并调节影响蚀刻去除的电流密度的情况下,与孔结构(6)的深度相对应的孔(b)在基板的第一表面上生成掩模(5)(参照图1),限定平行于第一表面(2)的孔结构(6)的横截面,并且(c)选择性地蚀刻,其中,通过去除形成侧壁的侧壁的硅来形成孔结构(6)。未被掩模(5)覆盖的孔(4)。优势-孔深度对应于孔结构的深度。

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