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DRAM with capacitor structure - has semiconductor substrate and doped region of opposite conductivity and insulating layer on substrate surface with aperture reaching to doped layer

机译:具有电容器结构的DRAM-具有半导体衬底和相反电导率的掺杂区,并且在衬底表面上具有绝缘层,且孔径达到掺杂层

摘要

There is a lower capacitor electrode (11) with a first section (11a) in contact with a surface of the doped layer, and a surface of the insulating layer (7). The second electrode section (11b) extends along the outer edge of the first electrode section and orthogonally to the semiconductor substrate (1) main surface. The second section of the lower capacitor electrode has a round end and a side surface of roughness of up to 200 angstrom. The surface of the lower electrode is covered by a capacitor insulating layer (12). A top capacitor electrode (13) covers the surface of the insulating layer. ADVANTAGE - Increased service life of the capacitor insulating layer, and smooth surface of electrode section.
机译:下部电容器电极(11)具有与掺杂层的表面和绝缘层(7)的表面相接触的第一部分(11a)。第二电极部分(11b)沿着第一电极部分的外边缘并且垂直于半导体衬底(1)主表面延伸。下电容器电极的第二部分具有圆形端部和侧面,该侧面的粗糙度最大为200埃。下电极的表面被电容器绝缘层(12)覆盖。顶部电容器电极(13)覆盖绝缘层的表面。优点-延长电容器绝缘层的使用寿命,并使电极部分的表面光滑。

著录项

  • 公开/公告号DE4318660A1

    专利类型

  • 公开/公告日1994-05-05

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI K.K. TOKIO/TOKYO JP;

    申请/专利号DE19934318660

  • 发明设计人 OGAWA TOSHIAKI ITAMI HYOGO JP;

    申请日1993-06-04

  • 分类号H01L27/108;G11C11/401;H01L21/72;

  • 国家 DE

  • 入库时间 2022-08-22 04:35:42

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