首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >LOW-CONDUCTIVITY DOPED LAYERS FOR IMPROVED PERFORMANCE OF THIN FILM SILICON SOLAR CELLS ON HIGHLY TEXTURED SUBSTRATES
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LOW-CONDUCTIVITY DOPED LAYERS FOR IMPROVED PERFORMANCE OF THIN FILM SILICON SOLAR CELLS ON HIGHLY TEXTURED SUBSTRATES

机译:低电导率掺杂层,用于提高薄膜硅太阳能电池在高度纹理的基材上的性能

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The performances of thin film silicon solar cells are reported for the use of increasingly rough zinc-oxide (ZnO) front electrodes. Experimental results show that textured substrates favor increased light trapping but also the local creation of undesired current drains, degrading the electrical performance of the cells. While an appropriate plasma treatment of the ZnO surface and a high silicon material quality are required to decrease the density of such current drains, doped nano-crystalline silicon oxide layers are proposed to limit the impact of these local non-uniformities onto the performance of both hydrogenated amorphous silicon (a-Si:H) and microcrystalline silicon (μc-Si:H) junctions. The possible physical roles of such low-conductivity doped layers are discussed. Conversion efficiency relative increase of 7% for a-Si:H single junction and of 4% to 20% for respectively low (0.3 nm/s) and high deposition rate (1 nm/s) i-layer in μc-Si:H junctions deposited on highly textured substrates are shown. Micromorph solar cells integrating such doped silicon oxide layers could be developed on rough ZnO front electrodes with a high light trapping potential with up to 13.7% and 11.5% initial and stabilized efficiency, respectively.
机译:据报道,薄膜硅太阳能电池的性能用于使用越来越粗糙的氧化锌(ZnO)前电极。实验结果表明,纹理的基材有利于增加光捕获,而且还有局部产生不需要的电流排水,降低细胞的电性能。虽然需要对ZnO表面和高硅材料质量的适当等离子体处理来降低这种电流漏极的密度,但提出了掺杂的纳米晶型氧化硅层,以限制这些局部不均匀性对两者均性能的影响氢化非晶硅(A-Si:H)和微晶硅(μC-Si:H)结。讨论了这种低导电率掺杂层的可能物理作用。转化效率对于A-Si:H单结的相对增加7%,分别为低(0.3nm / s)和高沉积速率(1nm / s)I层的4%〜20%:h显示了沉积在高度纹理的基材上的连接。微晶太阳能电池集成该掺杂的氧化硅层可在粗糙的ZnO前电极与分别高达13.7%和11.5%的初始和稳定效率,高的光俘获电位来开发。

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