首页> 外国专利> Electronic elements testing bus automatic control device especially for digital logic and micro-command logic cards - uses micro-controller or automatic control device which is controlled by micro logic device for testing electronic components

Electronic elements testing bus automatic control device especially for digital logic and micro-command logic cards - uses micro-controller or automatic control device which is controlled by micro logic device for testing electronic components

机译:电子元件测试总线自动控制设备,特别是用于数字逻辑和微指令逻辑卡的设备-使用由微逻辑设备控制的微控制器或自动控制设备来测试电子组件

摘要

The electronic control system uses a controller(4) controlled by microprocessor, which controls via a logic control unit(5) the testing bus(7) for testing electronic circuits(C1-C3) controlled by their microprocessor(2) without interrupting their operation. Data from the microprocessor is parallel transmitted to the control unit, and the control unit data is transmitted in parallel to the microprocessor. The control electronic device data is transmitted in series by the testing bus to the test elements, and the response of each of them is transmitted to control device along the same bus. ADVANTAGE - Is adaptable to different types of test bus, and permits testing of different electronic elements. Can be applied to all microprocessors but in association with logic cards controlled by test bus.
机译:电子控制系统使用由微处理器控制的控制器(4),该控制器(4)通过逻辑控制单元(5)控制测试总线(7),以测试由其微处理器(2)控制的电子电路(C1-C3),而不会中断其运行。来自微处理器的数据并行传输到控制单元,而控制单元数据并行传输到微处理器。控制电子设备数据通过测试总线串行传输到测试元件,每个测试元件的响应都沿着同一总线传输到控制设备。优点-适用于不同类型的测试总线,并允许测试不同的电子元件。可以应用于所有微处理器,但可以与受测试总线控制的逻辑卡结合使用。

著录项

  • 公开/公告号FR2692993A1

    专利类型

  • 公开/公告日1993-12-31

    原文格式PDF

  • 申请/专利权人 THOMSON CSF;

    申请/专利号FR19920008024

  • 申请日1992-06-30

  • 分类号G01R31/28;G06F9/06;

  • 国家 FR

  • 入库时间 2022-08-22 04:33:47

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号