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NON-CONTACT TYPE SURFACE POTENTIOMETER

机译:非接触型表面电位计

摘要

PURPOSE: To contrive to make an easier access to a sample to be detected and a miniaturization of a sensor element and the apparatus by eliminating effect due to a mechanical positional deviation in a non-contact type surface potentiometer to measure a surface potential of a photosensitive body or the like while miniaturizing a sensor probe. ;CONSTITUTION: A sensor element 11 is made up of a Pockels crystal, a polarizer, a wavelength plate and an analyzer, a detection electrode 13 is provided as arranged facing a sample 1 to be detected while an insulation layer 21 is provided between the detection electrode 13 and a crystal of the sensor element 11 and the detection electrode 13 is connected in series to an electrode 12a of the insulation layer 21 and an electrode 12b of the sensor element 11. Then, a surface potential of the sample 1 to be detected is determined with a signal processing section 15 from the intensity of light passing through the ockels crystal in the sensor element 1.;COPYRIGHT: (C)1995,JPO
机译:目的:通过消除非接触型表面电位计中机械位置偏差所引起的影响来测量光敏材料的表面电势,从而努力简化对待检测样品的访问,并使传感器元件和设备小型化。机身等,同时使传感器探头小型化。 ;组成:传感器元件11由普克尔斯晶体,偏振器,波长板和检偏器组成,检测电极13设置成面对要检测的样品1,而在检测之间设置绝缘层21电极13和传感器元件11的晶体以及检测电极13串联连接到绝缘层21的电极12a和传感器元件11的电极12b。然后,待检测样品1的表面电势由信号处理部分15根据通过传感器元件1中的克氏晶体的光强度确定。版权所有:(C)1995,JPO

著录项

  • 公开/公告号JPH0763803A

    专利类型

  • 公开/公告日1995-03-10

    原文格式PDF

  • 申请/专利权人 STANLEY ELECTRIC CO LTD;

    申请/专利号JP19930214029

  • 发明设计人 SHIBATA KANAME;

    申请日1993-08-30

  • 分类号G01R29/12;

  • 国家 JP

  • 入库时间 2022-08-22 04:21:02

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