首页> 外国专利> X-ray mask structure and a production method thereof, an exposure method using the X-ray mask structure, and a device fabricated by using the X- ray mask structure

X-ray mask structure and a production method thereof, an exposure method using the X-ray mask structure, and a device fabricated by using the X- ray mask structure

机译:X射线掩模结构及其制造方法,使用该x射线掩模结构的曝光方法以及通过使用该x射线掩模结构制造的器件

摘要

The present invention provides an X-ray mask structure a production method thereof, and an exposure method therefor, whereby patterns can be formed faithfully to designed device line widths regardless of the thickness distribution of an X-ray transmissive membrane. The present invention also provides a device exhibiting stable and high performance fabricated by means the X-ray mask structure. In accordance with the present invention, the X-ray mask structure comprises X-ray absorbers, an X-ray transmissive membrane for supporting the X-ray absorbers, and a supporting frame for supporting the X-ray transmissive membrane, wherein the line widths of the X-ray absorbers are compensated corresponding to the thickness distribution of the X-ray transmissive membrane so that the deviation of the line widths of transferred patterns from the desired line widths of the patterns may be cancelled. A method for producing the X-ray mask structure, an exposure method using the X- ray mask structure, and a device fabricated by use of the X-ray mask structure are also disclosed.
机译:本发明提供了一种X射线掩模结构,其制造方法以及其曝光方法,由此可以忠实地形成图案以与设计的器件线宽无关,而与X射线透射膜的厚度分布无关。本发明还提供了借助于X射线掩模结构制造的具有稳定和高性能的器件。根据本发明,X射线掩模结构包括X射线吸收体,用于支撑X射线吸收体的X射线透射膜,以及用于支撑X射线透射膜的支撑框架,其中线宽对应于X射线透射膜的厚度分布补偿X射线吸收剂的X射线吸收剂,从而可以消除转印的图案的线宽与图案的期望线宽之间的偏差。还公开了一种用于制造X射线掩模结构的方法,使用该X射线掩模结构的曝光方法以及通过使用该X射线掩模结构制造的器件。

著录项

  • 公开/公告号US5375157A

    专利类型

  • 公开/公告日1994-12-20

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US19930091383

  • 发明设计人 HIROSHI MAEHARA;

    申请日1993-07-15

  • 分类号G03F1/00;

  • 国家 US

  • 入库时间 2022-08-22 04:05:44

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