首页> 外国专利> FORMING METHOD OF DENSE TITANIUM NITRIDE FILM AND DENSE NITRIDE FILM/TITANIUM SILICIDE THIN FILM AND MANUFACTURE OF SEMICONDUCTOR DEVICE THEREWITH

FORMING METHOD OF DENSE TITANIUM NITRIDE FILM AND DENSE NITRIDE FILM/TITANIUM SILICIDE THIN FILM AND MANUFACTURE OF SEMICONDUCTOR DEVICE THEREWITH

机译:稠密氮化钛膜的形成方法以及稠密氮化钛膜/硅化钛薄膜及其制造方法

摘要

PURPOSE: To provide a method of forming a dense titanium film which contains an excessive amount of N though a sputtering method wherein a target where a titanium nitride film is formed on its surface is used in a sputtering method. ;CONSTITUTION: A target where a titanium nitride film is formed is subjected to sputtering so as to deposit a titanium film 41 which excessively contains nitrogen atoms on a semiconductor substrate 40, and the semiconductor substrate 40 is subjected to a quick thermal treatment twice, whereby a titanium silicide thin film 42 and a dense nitride film 43 are formed on the semiconductor substrate.;COPYRIGHT: (C)1996,JPO
机译:目的:通过溅射方法提供一种形成包含过量N的致密钛膜的方法,其中在溅射方法中使用在其表面上形成氮化钛膜的靶。 ;组成:对形成有氮化钛膜的靶进行溅射,以在半导体衬底40上沉积过量含有氮原子的钛膜41,并对半导体衬底40进行两次快速热处理,从而在半导体衬底上形成硅化钛薄膜42和致密氮化膜43。版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH08264448A

    专利类型

  • 公开/公告日1996-10-11

    原文格式PDF

  • 申请/专利权人 LG SEMICON CO LTD;

    申请/专利号JP19950079355

  • 发明设计人 HAKU NAM KIM;BYUN JEONG SOO;

    申请日1995-03-13

  • 分类号H01L21/203;C23C14/06;C23C14/08;C23C14/34;C23C14/58;H01L21/285;

  • 国家 JP

  • 入库时间 2022-08-22 04:04:01

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