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MAGNETIC TAPE INSPECTION METHOD AND MAGNETIC TAPE INSPECTION DEVICE

机译:磁带检查方法及磁带检查装置

摘要

PURPOSE: To provide a magnetic tape inspection method and a magnetic tape inspection device capable of surely inspecting defects caused by the scars, stains, defective shapes, foreign matter on the surface of a magnetic tape at a high S-N ratio. ;CONSTITUTION: When a sensor head 10 is arranged to face a traveling magnetic tape 13 to optically inspect the surface, the optical axis direction of the sensor head 10 is tilted by 5-9.5° relative to the normal line of the principal plane of the magnetic tape 13. When the optical axis of the sensor head 10 is tilted by 5-9.5° against the vertical direction, the signal output caused by a defect section is made relatively larger than the noise component, and it is detected at a high S-N ratio. The sensor head 10 is provided with a light projection section and a light reception section, light is applied from the light projection section, and the reflected light from the magnetic tape 13 is detected by the light reception section. The light projection section and light reception section are made of an optical fiber, for example.;COPYRIGHT: (C)1996,JPO
机译:目的:提供一种磁带检查方法和磁带检查装置,其能够以高S-N比可靠地检查由磁带上的疤痕,污点,缺陷形状,异物引起的缺陷。 ;组成:当传感器头10面对移动的磁带13进行光学检查表面时,传感器头10的光轴方向相对于传感器主平面的法线倾斜5-9.5°。磁带13。当传感器头10的光轴相对于垂直方向倾斜5-9.5°时,由缺陷部分引起的信号输出相对大于噪声分量,并且以高SN被检测到。比。传感器头10设置有光投射部和光接收部,从光投射部施加光,并且通过光接收部检测来自磁带13的反射光。光投射部和光接收部例如由光纤制成。版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH08201309A

    专利类型

  • 公开/公告日1996-08-09

    原文格式PDF

  • 申请/专利权人 SONY CHEM CORP;

    申请/专利号JP19950014635

  • 申请日1995-01-31

  • 分类号G01N21/89;G11B5/84;

  • 国家 JP

  • 入库时间 2022-08-22 03:59:46

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