Thermomigration factor measuring method and its device null of temperature conductivity

摘要

PURPOSE:To measure heat diffusivity and to measure even a light transmissive thin plate normally by shielding an area irradiated with flash light or at least a reverse surface area of the highly heat-conductive thin film corresponding to the irradiated area from a detector. CONSTITUTION:Part of the highly heat-conductive thin plate 2 is irradiated with laser flash light 5 and either of the irradiated area 7 and the reverse surface area 8 of the thin plate 2 corresponding to the area 7 is shielded from the detector 12. Then the detector 12 detects heat from the shielded area 11 to a detection area 13. Then a shield jig 1 placed in front of the thin plate 2 makes the flash light 5 incident on the thin plate 2. At this time, the flash light 5 is not converged, but passed partially through a through hole 4. Further, a shield plate 10 is placed behind the thin plate 2 to detect the temperature rise variation of the detection area 13 on the reverse surface 9 and a characteristic value is found from the obtained heat history curve, thereby measuring the heat diffusivity of even the light transmissive thin plate normally.