METHOD FOR DETERMINING DIRECTION SIGN OF CRYSTALLOGRAPHIC AXES IN CRYSTAL PIEZOIDS OF DOUBLE-TURN Y-CUT

摘要

FIELD: radio electronics. SUBSTANCE: oscillations of thickness-shear mode C are excited in crystal piezoid and resonance frequency is measured. Compressive forces are applied to piezoid at extreme points of its main edges on crystallographic axes X' and Z'. Direction of compressive forces is chosen to be perpendicular to its main edges. While compressive forces are applied, resonance frequency is measured again. Direction sign of crystallographic axes X' and Z' is determined by informative parameter which is change in resonance frequency. Positive direction of crystallographic axis Z' and negative direction of axis Z' is assumed to be direction from center of crystal piezoid to point on respective crystallographic axis at which compressive force cause positive change of resonance frequency. EFFECT: reduced damage to piezoids in determining sign of direction of their crystallographic axes.