METHOD FOR DETERMINING ORIENTATION crystallographic axes in an anisotropic electro-optical crystals of class 3m

摘要

A method for determining the orientation of the crystallographic axes of the anisotropic electro-optic crystal class 3m, carried out by an optical system comprising successively mounted perpendicular to the optical system of the light source axis of the polarizer, the analyzed crystal crossed with the polarizer analyzer, the screen and the DC electric field, comprising: passing radiation through optical system and obtaining an interference pattern on the screen, in appearance is judged on the location of the cristae llograficheskih axes X and Y, wherein as the test chip using the anisotropic electro-optical crystal class 3m with the known location of the crystallographic axis Z relative to the plane of the entrance face, characterized in that an optical system is passed divergent monochromatic light and receive the first conoscopic pattern as dark "Maltese cross" on the background of alternating light and dark concentric circles, then the crystal is applied to the test element constant electric field of the vector which is perpendicular to the crystallographic axis Z of tension to obtain a second conoscopic pattern in the form of two branches of a hyperbola on a background of alternating dark and light ovals, then around the optical system axis synchronously rotated by an angle ± φ * crossed polarizer and analyzer to obtain a third screen conoscopic pattern as a dark cross on a background of alternating dark and light ovals, hereinafter continuing to rotate crossed polarizer and analyzer an angle φ = ± 45 ° is obtained quat