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Energy filtering for electron back-scattered diffraction patterns
Energy filtering for electron back-scattered diffraction patterns
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机译:电子背散射衍射图的能量过滤
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摘要
A sample to be analyzed by a scanning electron microscope is held at an electrostatic potential higher than the recording plate of the microscope. This provides that electrons scattered from the sample which are at an energy level lower than a chosen level are drawn back into the sample by the potential of the sample, while other, higher energy scattered electrons reach the recording plate to form a pattern thereon.
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