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Optical integrated circuit type interferometer

机译:光学集成电路型干涉仪

摘要

PURPOSE:To detect a direction in which the phase of a measuring light changes based on the movement of an object along with higher resolutions, by providing an optical distance cycle changing means to cyclically vary a difference of an optical distance of reference light from that of the measuring light relatively at a fixed amplitude. CONSTITUTION:A thin film substrate 23 of an optical integrated circuit type interferometer 21 has a light waveguide 26 to divide coherent light P from a laser light source 20 into reference light P1 and measuring light P2 so that the measuring light P2 is introduced to a corner cube 24 as object and the reflected light thereof is made to interfere with the reference light P1 to be introduced to a photodetector 25. A pair of electrodes 34 provided sandwiching a reference light waveguide 29 with which the reference light P1 is taken out to be introduced to an incident waveguide 28 functions as optical distance cycle varying means to cyclically vary a difference of an optical distance of the reference light P1 from that of the measuring light P2. This enables detection of a direction in which the phase of the measuring light changes while allowing the removal of a DC bias component, thereby achieving higher resolutions.
机译:目的:通过提供一种光学距离循环改变装置,周期性地改变参考光的光学距离与被测物的光学距离的差,以检测测量光的相位随物体的运动以及更高的分辨率而变化的方向。测量光相对地以固定的幅度。组成:光学集成电路型干涉仪21的薄膜基板23具有光波导26,用于将来自激光光源20的相干光P分为参考光P1和测量光P2,从而将测量光P2引入角使作为对象的立方体24及其反射光与要引入到光检测器25的参考光P1干涉。设置有一对电极34,该电极34夹着将参考光P1取出以引入的参考光波导29。入射波导28的入射距离作为光程改变装置,周期性地改变基准光P1与测量光P2的光学距离之差。这使得能够检测测量光的相位改变的方向,同时允许去除DC偏置分量,从而实现更高的分辨率。

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