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Nanoscale on-chip all-optical logic parity checker in integrated plasmonic circuits in optical communication range

机译:集成等离子电路中光通信范围内的纳米级片上全光逻辑奇偶校验器

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摘要

The nanoscale chip-integrated all-optical logic parity checker is an essential core component for optical computing systems and ultrahigh-speed ultrawide-band information processing chips. Unfortunately, little experimental progress has been made in development of these devices to date because of material bottleneck limitations and a lack of effective realization mechanisms. Here, we report a simple and efficient strategy for direct realization of nanoscale chip-integrated all-optical logic parity checkers in integrated plasmonic circuits in the optical communication range. The proposed parity checker consists of two-level cascaded exclusive-OR (XOR) logic gates that are realized based on the linear interference of surface plasmon polaritons propagating in the plasmonic waveguides. The parity of the number of logic 1s in the incident four-bit logic signals is determined, and the output signal is given the logic state 0 for even parity (and 1 for odd parity). Compared with previous reports, the overall device feature size is reduced by more than two orders of magnitude, while ultralow energy consumption is maintained. This work raises the possibility of realization of large-scale integrated information processing chips based on integrated plasmonic circuits, and also provides a way to overcome the intrinsic limitations of serious surface plasmon polariton losses for on-chip integration applications.
机译:集成了纳米级芯片的全光学逻辑奇偶校验器是光学计算系统和超高速超宽带信息处理芯片的重要核心组件。不幸的是,由于材料瓶颈的限制和缺乏有效的实现机制,迄今为止在这些设备的开发方面几乎没有实验进展。在这里,我们报告了一种简单有效的策略,可以在光通信范围内的集成等离激元电路中直接实现纳米级芯片集成的全光逻辑奇偶校验器。所提出的奇偶校验器由两级级联的异或(XOR)逻辑门组成,它们是基于在等离激元波导中传播的表面等离激元极化子的线性干扰而实现的。确定入射的四位逻辑信号中逻辑1的数量的奇偶校验,并为输出信号提供偶数奇偶校验的逻辑状态0(奇数奇偶校验的逻辑状态为1)。与以前的报告相比,设备的整体功能尺寸减少了两个数量级以上,同时保持了超低能耗。这项工作提高了基于集成等离激元电路实现大规模集成信息处理芯片的可能性,也为克服片上集成应用中严重的表面等离激元极化子损耗的固有局限性提供了一种方法。

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