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dainamitsuku die semiconductor memory

机译:Dainami Tsukujie Semikonzu c和r记忆

摘要

PURPOSE:To attain the high speed of a device by inputting the output of a bipolar MOS type differential amplifying circuit to a MOS-FF circuit and restoring. CONSTITUTION:The data of a memory cell 20a and a dummy cell 12a is read to bit lines BL, BL, and a small potential difference is inputted to the base of the driver bipolar transistors T10, T12 of a circuit 56 through a C-MOS current mirror circuit 52a functioning as the impedance element of the bipolar C-MOS differential amplifier 56. Then, the amplified output of the circuit 56 is transferred to output lines OL1, OL2. It is fed back to an FF circuit 54 a through transfer gates FETQ54, Q56 and restored at high speed. Further, the potential difference in the bit lines goes to about 2V, an FF circuit 50a is operated to raise a voltage substantially to a supply voltage. Thereby, the high speed device can be attained.
机译:目的:通过将双极MOS型差分放大电路的输出输入到MOS-FF电路并进行恢复,来达到设备的高速化。构成:将存储单元20a和虚拟单元12a的数据读取到位线BL,BL,并通过C-MOS将小的电位差输入到电路56的驱动器双极晶体管T10,T12的基极电流镜电路52a用作双极C-MOS差分放大器56的阻抗元件。然后,电路56的放大输出被传送到输出线OL1,OL2。通过传输门FETQ54,Q56将其反馈到FF电路54a,并以高速恢复。此外,位线中的电位差达到约2V,操作FF电路50a以将电压基本升高到电源电压。由此,可以获得高速设备。

著录项

  • 公开/公告号JP2659949B2

    专利类型

  • 公开/公告日1997-09-30

    原文格式PDF

  • 申请/专利权人 TOSHIBA KK;

    申请/专利号JP19870055357

  • 申请日1987-03-12

  • 分类号G11C11/409;

  • 国家 JP

  • 入库时间 2022-08-22 03:29:08

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