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dainamitsuku die memory

机译:达米娜·祖库

摘要

PURPOSE:To avoid discontinuity between cell plate electrodes and give a common potential to those electrodes even if dimensions of capacitor parts are reduced compared to the dimensions of contact holes by arranging memory cells so as to be shifted by 1/2n (wherein (n) is a positive integer not less than 2) pitch. CONSTITUTION:Field oxide films 12 are selectively formed on a substrate 11 surface and island regions 13 composing two memory cells separated by the field oxide film 12 are also formed on the substrate 11 surface. The island regions 13 are so arranged as to be shifted by 1/4 pitch. Buried type capacitors 14 are provided near the both ends of the island regions 13. If the memory cells are so arranged as to be shifted by 1/4 pitch like this, as the minimum width of the cell plate electrode 17 corresponds to the length of the buried type capacitor 14, as long as the electrodes 17 are provided above the capacitors 14, the electrodes 17 are connected together diagonally and individual electrodes are not isolated however finely the memory cells are formed.
机译:目的:为避免单元板电极之间的不连续性,并通过将存储单元安排为偏移1 / 2n(即使其中电容器部分的尺寸与接触孔的尺寸相比减小了电容器部分的尺寸),也可以给这些电极提供公共电位。 (n)是一个不小于2)间距的正整数。组成:在衬底11的表面上选择性地形成场氧化膜12,并且在衬底11的表面上也形成由两个被场氧化膜12隔开的存储单元组成的岛区13。岛状区域13布置成以1/4节距偏移。在岛状区域13的两端附近设置有埋入型电容器14。如果像这样使存储单元以1/4间距错开地配置,则单元板电极17的最小宽度对应于单元板电极17的长度。埋入型电容器14,只要在电容器14的上方设置电极17,则电极17对角地连接在一起,并且不隔离各个电极,但是可以精细地形成存储单元。

著录项

  • 公开/公告号JPH0714006B2

    专利类型

  • 公开/公告日1995-02-15

    原文格式PDF

  • 申请/专利权人 株式会社東芝;

    申请/专利号JP19850115914

  • 发明设计人 古山 透;大澤 隆;

    申请日1985-05-29

  • 分类号H01L21/8242;H01L27/108;

  • 国家 JP

  • 入库时间 2022-08-22 04:26:49

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