CMOS Integrated Circuit Fault Detection System

摘要

The tester 1 repeatedly applies the tester pattern to the CMOS integrated circuit 4 in the tester and the power source unit 5 applies the tester pattern to the CMOS integrated circuit 4 through the current detector 6, And supplies current to the circuit (4). The current detector 6 outputs a detection signal connected to the power spectrum analyzer 8 via the amplifier 7 to drain the power spectrum. When the CMOS integrated circuit 4 fails, a static supply current separated from the transistor switching current is generated every predetermined (NT + T) seconds in a certain subpattern in the test pattern. The determining section 9 detects the power of the detection signal out of 1 / (NT + T) and thus determines the static current. That is, the CMOS integrated circuit 4 under test determines a failure.