首页> 外国专利> Semiconductor device for vertical direction integration and manufacturing method (SEMICONDUCTOR COMPONENT DESIGNED FOR VERTICAL INTEGRATION, AND METHOD OF MANUFACTURING THE COMPONENT)

Semiconductor device for vertical direction integration and manufacturing method (SEMICONDUCTOR COMPONENT DESIGNED FOR VERTICAL INTEGRATION, AND METHOD OF MANUFACTURING THE COMPONENT)

机译:用于垂直方向集成的半导体器件及其制造方法(专为垂直集成而设计的SEMICONDUCTOR组件及其制造方法)

摘要

The upper surface of the presented device has a layer structure comprising an insulating layer 7 with a hole, and the contact metallization 8 is provided on the upper surface of the insulating layer and in the region of the metallization for electrical contact. do. A metal contact post 12 fills a hole in the covering dielectric, which remains in the contact metallization so that it can resiliently move from the hole 14 of the device to the open end of the contact metallization. The other end of the contact metallization is fixed to the layer structure. This allows reverse contact of the device with other devices arranged vertically thereon. The planar upper surfaces of the two elements can be brought into contact with each other, since the post 12 pressing against the contact 15 on the other element is pushed back into the hole 14, the elastic force of this contact metallization between the contacts. Ensures a sufficiently reliable electrical contact.
机译:所提出的装置的上表面具有包括具有孔的绝缘层7的层结构,并且接触金属化层8设置在绝缘层的上表面上并且在金属化的区域中用于电接触。做。金属接触柱12填充覆盖电介质中的孔,该孔保留在接触金属化中,使得其可以从装置的孔14弹性地移动到接触金属化的开口端。接触金属化的另一端固定在层结构上。这允许设备与垂直布置在其上的其他设备反向接触。可以使两个元件的平面上表面彼此接触,因为压在另一个元件上的触点15上的柱12被推回到孔14中,所以该触点在触点之间的金属化作用的弹力。确保足够可靠的电接触。

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