Circuit testing method for low voltage circuits contg. switching and control devices for power circuits and connectors for control current circuits

摘要

The method involves preparing the characteristics of the switching and control devices used in the circuit (21) as data sets in a database (18) managed by a data processing system. A functional model (14) of the circuit is produced by evaluating the data of a current variation plan and the corresp. data sets. Circuit switching states are simulated (15) using the functional model by automatically specifying the settings of control devices and detecting and storing the resulting switching states. A test program is generated by evaluating the functional model for stepwise specification of switch handling. The circuit connections (19,20) are connected to a test device (10) and the test program conducted. The results are compared with those of a simulation of switching states of the functional model and a results message is output.