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Production method for ion-implanted MESFET having self-aligned lightly doped drain structure and T-type gate

机译:具有自对准轻掺杂漏极结构和t型栅极的离子注入式MESFET的制造方法

摘要

A production method for ion-implanted MESFET having self- aligned LDD structure and T-type gate, that the reverse mesa portion is formed at a predetermined part of the channel region which the source and drain regions are formed at both side by using caps layer, the ion is injected between the source and drain regions and the channel region as the small energy and low concentration by using the reverse mesa as the mask, the source and drain regions of the low concentration is formed so that drain part has more broadly than source part, and the gate electrode and the source and drain regions of the low concentration are not contacted at the formed groove which is removed the surface of the reverse mesa portion or the reverse mesa portion.
机译:一种具有自对准LDD结构和T型栅极的离子注入MESFET的生产方法,其中,通过使用盖层在形成沟道的预定部分的两侧形成反向台面部分,在沟道部分的预定部分上形成源极和漏极区域然后,通过使用反向台面作为掩模,以低能量和低浓度将离子注入到源极和漏极区域与沟道区域之间,形成低浓度的源极和漏极区域,使得漏极部分比源极部分和栅电极以及低浓度的源极和漏极区域在形成的凹槽处不接触,该凹槽被去除了反向台面部分或反向台面部分的表面。

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