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Method and apparatus for low temperature, low pressure chemical vapor deposition of epitaxial silicon layers

机译:外延硅层的低温低压化学气相沉积的方法和设备

摘要

A method and apparatus for depositing single crystal, epitaxial films of silicon on a plurality of substrates in a hot wall, isothermal deposition system is described. The deposition temperatures are less than about 800° C., and the operating pressures during deposition are such that non-equilibrium growth kinetics determine the deposition of the silicon films. An isothermal bath gas of silicon is produced allowing uniform deposition of epitaxial silicon films simultaneously on multiple substrates. This is a flow system in which means are provided for establishing an ultrahigh vacuum in the range of about 10.sup.-9 Torr prior to epitaxial deposition. The epitaxial silicon layers can be doped in-situ to provide very abruptly defined regions of either n- or p-type conductivity.
机译:描述了一种在热壁等温沉积系统中在多个衬底上沉积硅的单晶外延膜的方法和设备。沉积温度小于约800℃,并且在沉积期间的操作压力使得非平衡生长动力学决定了硅膜的沉积。产生硅的等温浴气体,从而允许在多个基板上同时均匀地沉积外延硅膜。这是一种流动系统,其中提供了用于在外延沉积之前建立约10 -9托的超高真空的装置。可以原位掺杂外延硅层,以提供非常突然定义的n型或p型导电性区域。

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