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Electronic circuit or board tester and method of testing an electronic device
Electronic circuit or board tester and method of testing an electronic device
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机译:电子电路或电路板测试仪以及测试电子设备的方法
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摘要
This invention relates to electronic circuit testing and more particularly to an apparatus and a method utilizing enhanced test data compression techniques. An electronic circuit or board tester according to the invention includes one tester circuit with a combination of a sequencer and a vector-sequencer-memory per pin. The test-data-sequence to be applied to a pin of a device under test is compressed in order to save memory space.
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