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Test method of electronic boards and devices for electronic circuit tester or
Test method of electronic boards and devices for electronic circuit tester or
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机译:电子线路板及电子线路测试仪或设备的测试方法
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摘要
This invention relates to electronic circuit testing and more particularly to an apparatus and a method utilizing enhanced test data compression techniques. An electronic circuit or board tester according to the invention comprises one tester circuit with a combination of a sequencer and a vector-sequencer-memory per pin. The test-data-sequence to be applied to a pin of a device under test is compressed in order to save memory space. IMAGE
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