An electronic circuit or board tester and a method of testing an electronic device

摘要

This invention relates to electronic circuit testing and more particularly to an apparatus and a method utilizing enhanced test data compression techniques. An electronic circuit or board tester according to the invention comprises one tester circuit with a combination of a sequencer and a vector-sequencer-memory per pin. The test-data-sequence to be applied to a pin of a device under test is compressed in order to save memory space.