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TESTING APPARATUS FOR PERFORMANCE OF PRODUCT

机译:产品性能测试仪

摘要

PROBLEM TO BE SOLVED: To obtain a testing apparatus whose test time is shortened and which enhances the productivity of a product by a method, wherein a plurality of test parts which comprise operating programs to execute tests respectively independently are provided and a control part which controls the test of the plurality of test parts and which adds up, stores and processes test results is provided. ;SOLUTION: A control part 4 receives a result from a test part 2 and outputs the result of a defect occurrence rate in one lot portion of products to a host computer 6. In addition, it receives data stored in the computer 6 it outputs a control signal on the basis of the data so as to execute the operation of a test. In addition, the computer 6 receives the result of the defect occurrence rate in every item in one lot portion of products, which is sent from the control part 4 in every test means 7 and adds up the defect occurrence rate for every item, including irregularities between lots so as to be stored as data. Data covering a half year's worth in the past is stored in the computer 6.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:通过一种方法,获得一种缩短了测试时间并且提高了产品生产率的测试设备,其中,提供了包括分别独立执行测试的操作程序的多个测试部件以及控制该控制部件的控制部件。提供了对多个测试部件的测试,并且这些测试部件相加,存储和处理测试结果。 ;解决方案:控制部分4从测试部分2接收结果,并将一批次产品中的缺陷发生率结果输出到主机6。此外,它接收存储在计算机6中的数据,并输出结果。根据数据控制信号,以执行测试操作。另外,计算机6从每一个测试装置7中的控制部4接收每一批产品中每件产品的缺陷发生率的结果,该结果从控制部件4发送,并且将每件产品的缺陷发生率加起来,包括不规则性。在批次之间存储为数据。过去半年价值的数据存储在计算机6中。版权所有:(C)1997,JPO

著录项

  • 公开/公告号JPH09292445A

    专利类型

  • 公开/公告日1997-11-11

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19960108839

  • 发明设计人 FUJITA HIROYUKI;

    申请日1996-04-30

  • 分类号G01R31/28;G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-22 03:06:32

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