首页> 外国专利> THIN-FILM TRANSISTOR, SEMICONDUCTOR MEMORY DEVICE HAVING THIN-FILM TRANSISTOR, AND ELECTRONIC APPARATUS HAVING THIN-FILM TRANSISTOR OR SEMICONDUCTOR MEMORY DEVICE

THIN-FILM TRANSISTOR, SEMICONDUCTOR MEMORY DEVICE HAVING THIN-FILM TRANSISTOR, AND ELECTRONIC APPARATUS HAVING THIN-FILM TRANSISTOR OR SEMICONDUCTOR MEMORY DEVICE

机译:薄膜晶体管,具有薄膜晶体管的半导体存储器以及具有薄膜晶体管或半导体存储器的电子设备

摘要

PROBLEM TO BE SOLVED: To stabilize a voltage-current characteristic by fixing the space between an offset and a contact within a specific range. ;SOLUTION: A TFT has an offset 54 between the gates 50 and the drain 52. And a space 58 of at least 0.3 m is secured between a contact region in the drain region and the offset 54. Namely, if the space 58 between the offset 54 and the contact 57 of the drain has a value of at least 0.3 m, it is possible for the TFT to have 0.2 m for p region of the drain 52 surely, even if there is an influence of mask dislocation, etc., of about 0.1 m. Accordingly, it becomes possible to secure each of the source (p-type), gate (n- type), offset (n- type), and drain (p-type) regions surely. By adopting a constitution like this, it becomes possible to stabilize the voltage-current characteristic of the TFT, and to improve the product characteristic of an electronic apparatus.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:通过将偏移量和触点之间的间距固定在特定范围内来稳定电压-电流特性。 ;解决方案:TFT在栅极50和漏极52之间具有偏移54。并且在漏极区域中的接触区域和偏移54之间确保至少0.3m的空间58。即,如果偏移54和漏极的接触57的值至少为0.3m,即使存在掩模错位等的影响,TFT对于漏极52的p区域也可以可靠地具有0.2m。约0.1 m因此,可以确保源极(p型),栅极(n -型),偏置(n -型)和漏极(p-类型)区域。通过采用这样的构造,可以使TFT的电压-电流特性稳定,并且可以改善电子设备的产品特性。;版权所有:(C)1998,JPO

著录项

  • 公开/公告号JPH10270698A

    专利类型

  • 公开/公告日1998-10-09

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP19970074211

  • 发明设计人 OGUCHI AKIRA;

    申请日1997-03-26

  • 分类号H01L29/786;H01L21/336;H01L21/8244;H01L27/11;

  • 国家 JP

  • 入库时间 2022-08-22 03:05:19

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