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METHOD FOR EVALUATING PROPERTY OF FINE PARTICLE USING FINE PARTICLE COMPONENT-ANALYZING APPARATUS

机译:用细颗粒成分分析仪评价细颗粒性能的方法

摘要

PROBLEM TO BE SOLVED: To evaluate properties of a fine particle or a set of fine particles by operating a composition ratio of a plurality of elements from a light emission coincidence and a light emission intensity of elements included in the fine particles and obtaining a correlation. ;SOLUTION: Solid fine particles to be measured and adhering to a filter 2 disposed in a disperser 1 are sucked by an aspirator 3 and supplied to a reaction tube 4. When microwaves of 2.45GHz frequency are introduced into a cavity 14 from a microwave source 13, approximately 4000K plasma is generated in the reaction tube 4, and the solid fine particles are atomized and ionized in the plasma. The solid fine particles emit light when falling into a ground state. The spectral emitted light is taken out in an axial direction from the reaction tube 4, condensed at 18 via an optical window 17 and guided through a slit 19 to a plurality of spectroscopes 20b adapted to respective wavelengths of elements. The light is split at the spectroscopes. A CPU 20a counts an emission intensity of elements emitting light simultaneously and an emission number of times, operates a composition ratio of the plurality of elements and evaluates a state of the fine particles from a correlation.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:通过根据微粒中包含的元素的发光重合度和发光强度操作多个元素的组成比并获得相关性,来评价微粒或一组微粒的性能。 ;解决方案:将要测量并粘附在分散器1中的过滤器2上的固体细颗粒通过吸气器3抽吸并输送到反应管4中。当将2.45 GHz频率的微波从微波源引入腔体14中时,如图13所示,在反应管4中产生约4000K的等离子体,并且固体细颗粒在等离子体中被雾化和离子化。当落入基态时,固体细颗粒发光。光谱发出的光从反应管4沿轴向被取出,在18处经由光学窗口17会聚,并通过狭缝19被引导到适合于元件的各个波长的多个光谱仪20b。光在分光镜处被分光。 CPU 20a对同时发光的元素的发光强度和发光次数进行计数,操作多个元素的组成比,并根据相关性来评价微粒的状态。COPYRIGHT:(C)1998,JPO

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