Inspection listed generation method and inspection listed generation device

摘要

PURPOSE: To obtain a method for generating a sequence to inspect a sequential circuit for obtaining a highly fault detection rate. ;CONSTITUTION: In a step 104, it is judged whether the inspection sequence generation processing count for a non-detected fault exceeds the maximum inspection sequence generation processing count for the non-detected fault which is set in a step 102 or not. In a step 108, the fault propagation processing for an inspection sequence generation is performed so that a signal line existing inside a prohibition D frontier aggregate of a target fault which is registered in a step 112 is not selected as the D frontier within a time frame for propagating the target fault to an external output pin. When the fault propagation processing of the inspection sequence generation fails, the D frontier which is selected within a specific time frame is registered to the prohibition D frontier aggregate of the target fault in the step 112, thus modifying a fault propagation path dynamically, increasing probability for succeeding in the inspection sequence generation, and generating the inspection sequence for obtaining a high fault detection rate.;COPYRIGHT: (C)1994,JPO&Japio