Secondary ion mass spectrometry and preparation manner null of the standard reference material which is used for

摘要

A method of analyzing a metal-containing sample by secondary ion mass spectrometry for the determination of the concentration of the metal is disclosed. The material is first formed into a solution and a drop thereof is placed onto an electrically conductive surface of a supporting disc. After drying, the resulting solid layer on the supporting disc is subjected to a secondary ion mass spectrometric analysis. When the sample is a liquid, the liquid may be directly placed on the supporting disc. This technique is applicable for the preparation of a standard sample having a known composition of metals and used for constructing a calibration curve.