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BiCMOS Integrated Circuit and Fabrication Process (BiCMOS Integrated Circuit and Fabrication Process Thereof)

机译:BiCMOS集成电路及其制造工艺(BiCMOS集成电路及其制造工艺)

摘要

The first photoresist layer has an opening in a region where an n-channel MOS transistor is to be formed and in an area in which a collector lid region is to be formed. Phosphorus is then implanted using the first photoresist layer as a mask. Then, the first photoresist layer is removed and a second photoresist layer is formed. The second photoresist layer has an opening in the region in which the emitter region is to be formed and in the region in which the collector liding region is to be formed. Phosphorus is implanted using a second photoresist layer as a mask, thereby forming an n-type selective diffusion region in a region below the region where the emitter region is to be formed and in a region where the collector liding region is to be formed. The second photoresist layer is then removed. A polycrystalline silicon layer is formed on the entire surface and arsenic is implanted into it to make n-type. Then, a heat treatment is performed to form an n-type diffusion layer in the region where the emitter region is to be formed and in the region where the emitter region and the collector liding region are to be formed.
机译:第一光致抗蚀剂层在将要形成n沟道MOS晶体管的区域以及将要形成集电极盖区域的区域中具有开口。然后使用第一光刻胶层作为掩模注入磷。然后,去除第一光刻胶层,并形成第二光刻胶层。第二光致抗蚀剂层在将要形成发射极区的区域中以及将要形成集电极覆盖区的区域中具有开口。使用第二光致抗蚀剂层作为掩模注入磷,从而在将要形成发射极区的区域下方的区域中以及将要形成集电极覆盖区的区域中形成n型选择性扩散区域。然后去除第二光刻胶层。在整个表面上形成多晶硅层,并向其中注入砷以形成n型。然后,执行热处理以在将要形成发射极区的区域中以及在将要形成发射极区和集电极盖区的区域中形成n型扩散层。

著录项

  • 公开/公告号KR19980018837A

    专利类型

  • 公开/公告日1998-06-05

    原文格式PDF

  • 申请/专利权人 가네꼬 히사시;

    申请/专利号KR19970039789

  • 发明设计人 사까모또 가요꼬;

    申请日1997-08-21

  • 分类号H01L27/085;

  • 国家 KR

  • 入库时间 2022-08-22 02:48:34

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