首页> 外国专利> Bump uniformizing apparatus for semiconductor chip and bump uniformizing method using the same

Bump uniformizing apparatus for semiconductor chip and bump uniformizing method using the same

机译:半导体芯片的凸点均匀化装置及使用其的凸点均匀化方法

摘要

A bump uniformizing apparatus for a semiconductor chip is provided. The present invention relates to an apparatus for bump homogenization of a semiconductor chip constituted by a main section for making bumps of a semiconductor chip uniform and a system section connected to the main section for controlling the main section, A bump smoothing unit connected to the bump smoothing unit and connected to the bump smoothing unit and configured to apply a load to the bump smoothing unit, And a cylinder portion having a load sensor, wherein the system portion includes a temperature change display portion for displaying and controlling the operation of the temperature adjusting device of the bump fused portion, and a temperature change display portion for displaying and controlling the pressure applied to the bump smoothing portion by the load sensor A position change display section for displaying and controlling the distance that the bump uniformizing section is moved up and down, It includes. According to the present invention, the uniformity of the range formed on the semiconductor wafer and the intermetallic alloy layer of the bumps (alloying of bumps) can be achieved at the same time.
机译:提供一种用于半导体芯片的凸块均匀化设备。半导体芯片的凸块均化装置技术领域本发明涉及一种用于使半导体芯片的凸块均质化的装置,该装置由用于使半导体芯片的凸块均匀的主体部分和与该主体部分相连的用于控制该主体部分的系统部分构成。缸体部具有负载传感器,其中,系统部包括温度变化显示部,该温度变化显示部用于显示和控制温度调节的操作,该缸体部具有载荷传感器,该缸体部具有载荷传感器。凸点熔接部分的装置,以及温度变化显示部分,用于显示和控制由负载传感器施加到凸块平滑部分的压力。位置变化显示部分,用于显示和控制凸点均匀化部分上下移动的距离, 这包括。根据本发明,可以同时实现在半导体晶片和凸块的金属间合金层上形成的范围的均匀性(凸块的合金化)。

著录项

  • 公开/公告号KR19980067555A

    专利类型

  • 公开/公告日1998-10-15

    原文格式PDF

  • 申请/专利权人 구자홍;

    申请/专利号KR19970003643

  • 发明设计人 박종욱;유영빈;

    申请日1997-02-05

  • 分类号H01L21/60;

  • 国家 KR

  • 入库时间 2022-08-22 02:47:42

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