Non-contact semiconductor imaging device with direct focus method with self-focusing function

摘要

The present invention relates to a direct-irradiation-type non-contact semiconductor imaging device having a self-focusing function, and more particularly, to a direct-irradiation-type non-contact semiconductor imaging device having a self-focusing function, 1. A direct-irradiation-type non-contact semiconductor imaging element comprising: a light-receiving element formed on a semiconductor substrate and converting incident light into a signal charge; A first light-shielding film formed on the transparent insulating film on the light-receiving element and restricting incident light incident on the light-receiving element; And a second light blocking film formed on the transparent protective film on the first light blocking film and for limiting incident light incident on the opening of the first light blocking film. Therefore, the semiconductor image pickup device of the present invention can have a self-focusing function by adding a light-shielding film which can only receive vertically incident light on the sensor itself without adding a separate lens structure. Therefore, It is possible to reduce the production cost of the apparatus.